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From:   Lad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com>
To:     Jacopo Mondi <jacopo@jmondi.org>,
        Sakari Ailus <sakari.ailus@linux.intel.com>,
        Laurent Pinchart <laurent.pinchart+renesas@ideasonboard.com>,
        Mauro Carvalho Chehab <mchehab@kernel.org>
Cc:     linux-media@vger.kernel.org, linux-kernel@vger.kernel.org,
        linux-renesas-soc@vger.kernel.org,
        Biju Das <biju.das.jz@bp.renesas.com>,
        Lad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com>,
        Prabhakar <prabhakar.csengg@gmail.com>
Subject: [PATCH v4 0/3] media: i2c: ov772x: Enable BT656 mode and test pattern support
Date:   Sun, 13 Sep 2020 19:42:44 +0100
Message-Id: <20200913184247.618-1-prabhakar.mahadev-lad.rj@bp.renesas.com>
Sender: linux-kernel-owner@vger.kernel.org
Precedence: bulk

Hi All,

This patch series adds support for BT656 mode in the ov772x sensor
and also enables color bar test pattern control.

Cheers,
Prabhakar

Changes for v4:
* New patch 1/3 to fallback in parallel mode.
* Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep.
* Dropped support for pdat for test pattern control.
* DT documentation patches [1].

Changes for v3:
* Dropped DT binding documentation patch as this is handled by Jacopo.
* Fixed review comments pointed by Jacopo.

[1] https://patchwork.kernel.org/project/linux-renesas-soc/list/?series=346809

Lad Prabhakar (3):
  media: i2c: ov772x: Parse endpoint properties
  media: i2c: ov772x: Add support for BT656 mode
  media: i2c: ov772x: Add test pattern control

 drivers/media/i2c/ov772x.c | 56 +++++++++++++++++++++++++++++++++++++-
 1 file changed, 55 insertions(+), 1 deletion(-)

-- 
2.17.1