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[198.48.202.89]) by smtp.gmail.com with ESMTPSA id u10sm6003213qtx.3.2021.11.27.12.27.08 (version=TLS1_3 cipher=TLS_AES_256_GCM_SHA384 bits=256/256); Sat, 27 Nov 2021 12:27:08 -0800 (PST) Date: Sat, 27 Nov 2021 15:27:06 -0500 From: Liam Beguin To: Peter Rosin Cc: jic23@kernel.org, lars@metafoo.de, linux-kernel@vger.kernel.org, linux-iio@vger.kernel.org, devicetree@vger.kernel.org, robh+dt@kernel.org Subject: Re: [PATCH v9 00/14] iio: afe: add temperature rescaling support Message-ID: References: <20211115034334.1713050-1-liambeguin@gmail.com> <156bc2fa-6754-2350-4a12-ff25b23ae8a2@axentia.se> MIME-Version: 1.0 Content-Type: text/plain; charset=us-ascii Content-Disposition: inline In-Reply-To: <156bc2fa-6754-2350-4a12-ff25b23ae8a2@axentia.se> Precedence: bulk List-ID: X-Mailing-List: linux-kernel@vger.kernel.org Hi Peter, On Mon, Nov 22, 2021 at 01:53:44AM +0100, Peter Rosin wrote: > Hi Liam! > > On 2021-11-15 04:43, Liam Beguin wrote: > > Hi Jonathan, Peter, > > > > Apologies for not getting back to you sooner. I got caught up on other > > work and wasn't able to dedicate time to this earlier. Hopefully, this > > time around, I'll be able to get this to the finish line :-) > > > > I left out IIO_VAL_INT overflows for now, so that I can focus on getting > > the rest of these changes pulled in, but I don't mind adding a patch for > > that later on. > > > > This series focuses on adding temperature rescaling support to the IIO > > Analog Front End (AFE) driver. > > > > The first few patches address minor bugs in IIO inkernel functions, and > > prepare the AFE driver for the additional features. > > > > The main changes to the AFE driver include an initial Kunit test suite, > > support for IIO_VAL_INT_PLUS_{NANO,MICRO} scales, and support for RTDs > > and temperature transducer sensors. > > > > Thanks for your time, > > And thanks for yours! > > > Liam > > > > Changes since v8: > > - reword comment > > - fix erroneous 64-bit division > > - optimize and use 32-bit divisions when values are know to not overflow > > - keep IIO_VAL_FRACTIONAL scale when possible, if not default to fixed > > point > > This is not what is going on. Patch 9/14 will convert all fractional > scales to fixed point. But I would really like if you in the "reduce > risk of integer overflow" patch (8/14) would hold true to the above > and keep the fractional scale when possible and only fall back to > the less precise fractional-log case if any of the multiplications > needed for an exact fractional scale causes overflow. Thanks for looking at these patches again. > The v8 discussion concluded that this was a valid approach, right? Yes, I remember you saying that you'd be more comfortable keeping the IIO_VAL_FRACTIONAL. > I know you also said that the core exposes the scale with nano > precision in sysfs anyway, but that is not true for in-kernel > consumers. They have an easier time reading the "real" scale value > compared to going via the string representation of fixed point > returned from iio_format_value. At least the rescaler itself does so, > which means that chaining rescalers might suffer needless accuracy > degradation. Agreed, that makes total sense. If I'm not mistaken, the first condition in the case, if (!rem), will return IIO_VAL_FRACTIONAL if the division is exact, keeping all the precision. No? > So, please add the overflow fallback thingy right away, it would make > me feel much better. > > > - add test cases > > - use nano precision in test cases > > - simplify offset calculation in rtd_props() > > > > Changes since v7: > > - drop gcd() logic in rescale_process_scale() > > - use div_s64() instead of do_div() for signed 64-bit divisions > > - combine IIO_VAL_FRACTIONAL and IIO_VAL_FRACTIONAL_LOG2 scale cases > > - switch to INT_PLUS_NANO when accuracy is lost with FRACTIONAL scales > > - rework test logic to allow for small relative error > > - rename test variables to align error output messages > > > > Changes since v6: > > - rework IIO_VAL_INT_PLUS_{NANO,MICRO} based on Peter's suggestion > > - combine IIO_VAL_INT_PLUS_{NANO,MICRO} cases > > - add test cases for negative IIO_VAL_INT_PLUS_{NANO,MICRO} corner cases > > - force use of positive integers with gcd() > > - reduce risk of integer overflow in IIO_VAL_FRACTIONAL_LOG2 > > - fix duplicate symbol build error > > - apply Reviewed-by > > > > Changes since v5: > > - add include/linux/iio/afe/rescale.h > > - expose functions use to process scale and offset > > - add basic iio-rescale kunit test cases > > - fix integer overflow case > > - improve precision for IIO_VAL_FRACTIONAL_LOG2 > > > > Changes since v4: > > - only use gcd() when necessary in overflow mitigation > > - fix INT_PLUS_{MICRO,NANO} support > > - apply Reviewed-by > > - fix temperature-transducer bindings > > > > Changes since v3: > > - drop unnecessary fallthrough statements > > - drop redundant local variables in some calculations > > - fix s64 divisions on 32bit platforms by using do_div > > - add comment describing iio-rescaler offset calculation > > - drop unnecessary MAINTAINERS entry > > > > Changes since v2: > > - don't break implicit offset truncations > > - make a best effort to get a valid value for fractional types > > - drop return value change in iio_convert_raw_to_processed_unlocked() > > - don't rely on processed value for offset calculation > > - add INT_PLUS_{MICRO,NANO} support in iio-rescale > > - revert generic implementation in favor of temperature-sense-rtd and > > temperature-transducer > > - add separate section to MAINTAINERS file > > > > Changes since v1: > > - rebase on latest iio `testing` branch > > - also apply consumer scale on integer channel scale types > > - don't break implicit truncation in processed channel offset > > calculation > > - drop temperature AFE flavors in favor of a simpler generic > > implementation > > > > Liam Beguin (14): > > iio: inkern: apply consumer scale on IIO_VAL_INT cases > > iio: inkern: apply consumer scale when no channel scale is available > > iio: inkern: make a best effort on offset calculation > > iio: afe: rescale: expose scale processing function > > iio: afe: rescale: add INT_PLUS_{MICRO,NANO} support > > iio: afe: rescale: add offset support > > iio: afe: rescale: use s64 for temporary scale calculations > > iio: afe: rescale: reduce risk of integer overflow > > iio: afe: rescale: fix accuracy for small fractional scales > > Can you please swap the order of these two patches? (i.e. "reduce > risk..." and "fix accuracy...") > > Basically, I think the accuracy of the IIO_VAL_FRACTIONAL_LOG2 > case should be improved before the IIO_VAL_FRACTIONAL case is > joined with it. I.e. swap the order of 8/14 and 9/14 (or almost, > you need to also move the addition of the > scale_type == IIO_VAL_FRACTIONAL condition to the other patch in > order for it to make sense). Makes sense! I'll swap the order of these commits. > That's all I'm finding. But then again, I don't know what to do > about the 0day report on 10/14. It does say that it's a W=1 > build, maybe we need not worry about it? I didn't have a chance to look into that more, but will now. Cheers, Liam > Cheers, > Peter > > > iio: test: add basic tests for the iio-rescale driver > > iio: afe: rescale: add RTD temperature sensor support > > iio: afe: rescale: add temperature transducers > > dt-bindings: iio: afe: add bindings for temperature-sense-rtd > > dt-bindings: iio: afe: add bindings for temperature transducers >