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Date:   Tue, 10 Oct 2023 17:09:18 +0100
From:   Jonathan Cameron <jic23@kernel.org>
To:     David Lechner <dlechner@baylibre.com>
Cc:     linux-iio@vger.kernel.org, linux-staging@lists.linux.dev,
        Michael Hennerich <Michael.Hennerich@analog.com>,
        Nuno =?UTF-8?B?U8Oh?= <nuno.sa@analog.com>,
        Axel Haslam <ahaslam@baylibre.com>,
        Philip Molloy <pmolloy@baylibre.com>,
        linux-kernel@vger.kernel.org
Subject: Re: [PATCH v4 16/17] staging: iio: resolver: ad2s1210: remove fault
 attribute
Message-ID: <20231010170918.5f2d2595@jic23-huawei>
In-Reply-To: <20231005-ad2s1210-mainline-v4-16-ec00746840fc@baylibre.com>
References: <20231005-ad2s1210-mainline-v4-0-ec00746840fc@baylibre.com>
        <20231005-ad2s1210-mainline-v4-16-ec00746840fc@baylibre.com>
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On Thu,  5 Oct 2023 19:50:33 -0500
David Lechner <dlechner@baylibre.com> wrote:

> Faults have been converted to events and we are now polling the fault
> register each time we read a sample, so we no longer need the fault
> attribute.
> 
> This attribute was not suitable for promotion out of staging anyway
> since it was returning multiple values in a single attribute.
> 
> The fault clearing feature should not be needed unless we need to
> support the fault output pins on the chip which is not currently
> supported. So we can add this feature back in if we need it later.
> 
> Signed-off-by: David Lechner <dlechner@baylibre.com>
Applied