When possible use dev_err_probe help to properly deal with the
PROBE_DEFER error, the benefit is that DEFER issue will be logged
in the devices_deferred debugfs file.
Using dev_err_probe() can reduce code size, and the error value
gets printed.
Signed-off-by: Cai Huoqing <[email protected]>
---
drivers/nfc/trf7970a.c | 8 ++++----
1 file changed, 4 insertions(+), 4 deletions(-)
diff --git a/drivers/nfc/trf7970a.c b/drivers/nfc/trf7970a.c
index 8890fcd59c39..8459a2735f2c 100644
--- a/drivers/nfc/trf7970a.c
+++ b/drivers/nfc/trf7970a.c
@@ -2067,8 +2067,8 @@ static int trf7970a_probe(struct spi_device *spi)
trf->regulator = devm_regulator_get(&spi->dev, "vin");
if (IS_ERR(trf->regulator)) {
- ret = PTR_ERR(trf->regulator);
- dev_err(trf->dev, "Can't get VIN regulator: %d\n", ret);
+ ret = dev_err_probe(trf->dev, PTR_ERR(trf->regulator),
+ "Can't get VIN regulator\n");
goto err_destroy_lock;
}
@@ -2084,8 +2084,8 @@ static int trf7970a_probe(struct spi_device *spi)
trf->regulator = devm_regulator_get(&spi->dev, "vdd-io");
if (IS_ERR(trf->regulator)) {
- ret = PTR_ERR(trf->regulator);
- dev_err(trf->dev, "Can't get VDD_IO regulator: %d\n", ret);
+ ret = dev_err_probe(trf->dev, PTR_ERR(trf->regulator),
+ "Can't get VDD_IO regulator\n");
goto err_destroy_lock;
}
--
2.25.1