We have a board where measurements indicate that the current three
options - leaving IO_IMPEDANCE_CTRL at the (factory calibrated) reset
value or using one of the two boolean properties to set it to the
min/max value - are too coarse.
This series adds a device tree binding for an nvmem cell which can be
populated during production with a suitable value calibrated for each
board, and corresponding support in the driver. The second patch adds
a trivial phy wrapper for dev_err_probe(), used in the third.
Rasmus Villemoes (3):
dt-bindings: dp83867: add binding for io_impedance_ctrl nvmem cell
linux/phy.h: add phydev_err_probe() wrapper for dev_err_probe()
net: phy: dp83867: implement support for io_impedance_ctrl nvmem cell
.../devicetree/bindings/net/ti,dp83867.yaml | 18 +++++-
drivers/net/phy/dp83867.c | 55 +++++++++++++++++--
include/linux/phy.h | 3 +
3 files changed, 67 insertions(+), 9 deletions(-)
--
2.31.1
The dev_err_probe() function is quite useful to avoid boilerplate
related to -EPROBE_DEFER handling. Add a phydev_err_probe() helper to
simplify making use of that from phy drivers which otherwise use the
phydev_* helpers.
Signed-off-by: Rasmus Villemoes <[email protected]>
---
include/linux/phy.h | 3 +++
1 file changed, 3 insertions(+)
diff --git a/include/linux/phy.h b/include/linux/phy.h
index 508f1149665b..bed9a347481b 100644
--- a/include/linux/phy.h
+++ b/include/linux/phy.h
@@ -1539,6 +1539,9 @@ static inline void phy_device_reset(struct phy_device *phydev, int value)
#define phydev_err(_phydev, format, args...) \
dev_err(&_phydev->mdio.dev, format, ##args)
+#define phydev_err_probe(_phydev, err, format, args...) \
+ dev_err_probe(&_phydev->mdio.dev, err, format, ##args)
+
#define phydev_info(_phydev, format, args...) \
dev_info(&_phydev->mdio.dev, format, ##args)
--
2.31.1
We have a board where measurements indicate that the current three
options - leaving IO_IMPEDANCE_CTRL at the reset value (which is
factory calibrated to a value corresponding to approximately 50 ohms)
or using one of the two boolean properties to set it to the min/max
value - are too coarse.
This series adds a device tree binding for an nvmem cell which can be
populated during production with a suitable value calibrated for each
board, and corresponding support in the driver. The second patch adds
a trivial phy wrapper for dev_err_probe(), used in the third.
v2: Improve commit message for patch 1; add Rob's R-b to patch 1. No
changes in the patches themselves.
Since Dan Murphy's email address bounces, cc'ing two other @ti.com
addresses that have touched the driver in recent years.
Rasmus Villemoes (3):
dt-bindings: dp83867: add binding for io_impedance_ctrl nvmem cell
linux/phy.h: add phydev_err_probe() wrapper for dev_err_probe()
net: phy: dp83867: implement support for io_impedance_ctrl nvmem cell
.../devicetree/bindings/net/ti,dp83867.yaml | 18 +++++-
drivers/net/phy/dp83867.c | 55 +++++++++++++++++--
include/linux/phy.h | 3 +
3 files changed, 67 insertions(+), 9 deletions(-)
--
2.31.1
We have a board where measurements indicate that the current three
options - leaving IO_IMPEDANCE_CTRL at the (factory calibrated) reset
value or using one of the two boolean properties to set it to the
min/max value - are too coarse.
Implement support for the newly added binding allowing device tree to
specify an nvmem cell containing an appropriate value for this
specific board.
Signed-off-by: Rasmus Villemoes <[email protected]>
---
drivers/net/phy/dp83867.c | 55 ++++++++++++++++++++++++++++++++++-----
1 file changed, 49 insertions(+), 6 deletions(-)
diff --git a/drivers/net/phy/dp83867.c b/drivers/net/phy/dp83867.c
index 8561f2d4443b..45d8a9298251 100644
--- a/drivers/net/phy/dp83867.c
+++ b/drivers/net/phy/dp83867.c
@@ -14,6 +14,7 @@
#include <linux/netdevice.h>
#include <linux/etherdevice.h>
#include <linux/bitfield.h>
+#include <linux/nvmem-consumer.h>
#include <dt-bindings/net/ti-dp83867.h>
@@ -521,6 +522,51 @@ static int dp83867_verify_rgmii_cfg(struct phy_device *phydev)
}
#if IS_ENABLED(CONFIG_OF_MDIO)
+static int dp83867_of_init_io_impedance(struct phy_device *phydev)
+{
+ struct dp83867_private *dp83867 = phydev->priv;
+ struct device *dev = &phydev->mdio.dev;
+ struct device_node *of_node = dev->of_node;
+ struct nvmem_cell *cell;
+ u8 *buf, val;
+ int ret;
+
+ cell = of_nvmem_cell_get(of_node, "io_impedance_ctrl");
+ if (IS_ERR(cell)) {
+ ret = PTR_ERR(cell);
+ if (ret != -ENOENT)
+ return phydev_err_probe(phydev, ret,
+ "failed to get nvmem cell io_impedance_ctrl\n");
+
+ /* If no nvmem cell, check for the boolean properties. */
+ if (of_property_read_bool(of_node, "ti,max-output-impedance"))
+ dp83867->io_impedance = DP83867_IO_MUX_CFG_IO_IMPEDANCE_MAX;
+ else if (of_property_read_bool(of_node, "ti,min-output-impedance"))
+ dp83867->io_impedance = DP83867_IO_MUX_CFG_IO_IMPEDANCE_MIN;
+ else
+ dp83867->io_impedance = -1; /* leave at default */
+
+ return 0;
+ }
+
+ buf = nvmem_cell_read(cell, NULL);
+ nvmem_cell_put(cell);
+
+ if (IS_ERR(buf))
+ return PTR_ERR(buf);
+
+ val = *buf;
+ kfree(buf);
+
+ if ((val & DP83867_IO_MUX_CFG_IO_IMPEDANCE_MASK) != val) {
+ phydev_err(phydev, "nvmem cell 'io_impedance_ctrl' contents out of range\n");
+ return -ERANGE;
+ }
+ dp83867->io_impedance = val;
+
+ return 0;
+}
+
static int dp83867_of_init(struct phy_device *phydev)
{
struct dp83867_private *dp83867 = phydev->priv;
@@ -548,12 +594,9 @@ static int dp83867_of_init(struct phy_device *phydev)
}
}
- if (of_property_read_bool(of_node, "ti,max-output-impedance"))
- dp83867->io_impedance = DP83867_IO_MUX_CFG_IO_IMPEDANCE_MAX;
- else if (of_property_read_bool(of_node, "ti,min-output-impedance"))
- dp83867->io_impedance = DP83867_IO_MUX_CFG_IO_IMPEDANCE_MIN;
- else
- dp83867->io_impedance = -1; /* leave at default */
+ ret = dp83867_of_init_io_impedance(phydev);
+ if (ret)
+ return ret;
dp83867->rxctrl_strap_quirk = of_property_read_bool(of_node,
"ti,dp83867-rxctrl-strap-quirk");
--
2.31.1
The dev_err_probe() function is quite useful to avoid boilerplate
related to -EPROBE_DEFER handling. Add a phydev_err_probe() helper to
simplify making use of that from phy drivers which otherwise use the
phydev_* helpers.
Signed-off-by: Rasmus Villemoes <[email protected]>
---
include/linux/phy.h | 3 +++
1 file changed, 3 insertions(+)
diff --git a/include/linux/phy.h b/include/linux/phy.h
index 508f1149665b..bed9a347481b 100644
--- a/include/linux/phy.h
+++ b/include/linux/phy.h
@@ -1539,6 +1539,9 @@ static inline void phy_device_reset(struct phy_device *phydev, int value)
#define phydev_err(_phydev, format, args...) \
dev_err(&_phydev->mdio.dev, format, ##args)
+#define phydev_err_probe(_phydev, err, format, args...) \
+ dev_err_probe(&_phydev->mdio.dev, err, format, ##args)
+
#define phydev_info(_phydev, format, args...) \
dev_info(&_phydev->mdio.dev, format, ##args)
--
2.31.1
We have a board where measurements indicate that the current three
options - leaving IO_IMPEDANCE_CTRL at the reset value (which is
factory calibrated to a value corresponding to approximately 50 ohms)
or using one of the two boolean properties to set it to the min/max
value - are too coarse.
There is no fixed mapping from register values to values in the range
35-70 ohms; it varies from chip to chip, and even that target range is
approximate. So add a DT binding for an nvmem cell which can be
populated during production with a value suitable for each specific
board.
Reviewed-by: Rob Herring <[email protected]>
Signed-off-by: Rasmus Villemoes <[email protected]>
---
.../devicetree/bindings/net/ti,dp83867.yaml | 18 +++++++++++++++---
1 file changed, 15 insertions(+), 3 deletions(-)
diff --git a/Documentation/devicetree/bindings/net/ti,dp83867.yaml b/Documentation/devicetree/bindings/net/ti,dp83867.yaml
index 047d757e8d82..76ff08a477ba 100644
--- a/Documentation/devicetree/bindings/net/ti,dp83867.yaml
+++ b/Documentation/devicetree/bindings/net/ti,dp83867.yaml
@@ -31,6 +31,16 @@ properties:
reg:
maxItems: 1
+ nvmem-cells:
+ maxItems: 1
+ description:
+ Nvmem data cell containing the value to write to the
+ IO_IMPEDANCE_CTRL field of the IO_MUX_CFG register.
+
+ nvmem-cell-names:
+ items:
+ - const: io_impedance_ctrl
+
ti,min-output-impedance:
type: boolean
description: |
@@ -42,9 +52,11 @@ properties:
description: |
MAC Interface Impedance control to set the programmable output impedance
to a maximum value (70 ohms).
- Note: ti,min-output-impedance and ti,max-output-impedance are mutually
- exclusive. When both properties are present ti,max-output-impedance
- takes precedence.
+ Note: Specifying an io_impedance_ctrl nvmem cell or one of the
+ ti,min-output-impedance, ti,max-output-impedance properties
+ are mutually exclusive. If more than one is present, an nvmem
+ cell takes precedence over ti,max-output-impedance, which in
+ turn takes precedence over ti,min-output-impedance.
tx-fifo-depth:
$ref: /schemas/types.yaml#/definitions/uint32
--
2.31.1
Hello:
This series was applied to netdev/net-next.git (master)
by Jakub Kicinski <[email protected]>:
On Tue, 14 Jun 2022 10:46:09 +0200 you wrote:
> We have a board where measurements indicate that the current three
> options - leaving IO_IMPEDANCE_CTRL at the reset value (which is
> factory calibrated to a value corresponding to approximately 50 ohms)
> or using one of the two boolean properties to set it to the min/max
> value - are too coarse.
>
> This series adds a device tree binding for an nvmem cell which can be
> populated during production with a suitable value calibrated for each
> board, and corresponding support in the driver. The second patch adds
> a trivial phy wrapper for dev_err_probe(), used in the third.
>
> [...]
Here is the summary with links:
- [net-next,v2,1/3] dt-bindings: dp83867: add binding for io_impedance_ctrl nvmem cell
https://git.kernel.org/netdev/net-next/c/ab1e9de84aff
- [net-next,v2,2/3] linux/phy.h: add phydev_err_probe() wrapper for dev_err_probe()
https://git.kernel.org/netdev/net-next/c/a793679827a8
- [net-next,v2,3/3] net: phy: dp83867: implement support for io_impedance_ctrl nvmem cell
https://git.kernel.org/netdev/net-next/c/5c2d0a6a0701
You are awesome, thank you!
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