The AD2S1210 has a programmable threshold for the degradation of signal
(DOS) overrange fault. This fault is triggered when either the sine or
cosine input rises above the threshold voltage.
This patch converts the custom device DOS overrange threshold attribute
to an event rising edge threshold attribute on the monitor signal
channel.
The attribute now uses millivolts instead of the raw register value in
accordance with the IIO ABI.
Emitting the event will be implemented in a later patch.
Signed-off-by: David Lechner <[email protected]>
---
v4 changes:
* Fixed missing word in commit message.
* Fixed missing static qualifier on attribute definition.
v3 changes: This is a new patch in v3
drivers/staging/iio/resolver/ad2s1210.c | 20 ++++++++++++++++----
1 file changed, 16 insertions(+), 4 deletions(-)
diff --git a/drivers/staging/iio/resolver/ad2s1210.c b/drivers/staging/iio/resolver/ad2s1210.c
index d52aed30ca66..3c224bbeae17 100644
--- a/drivers/staging/iio/resolver/ad2s1210.c
+++ b/drivers/staging/iio/resolver/ad2s1210.c
@@ -747,9 +747,6 @@ static int ad2s1210_write_raw(struct iio_dev *indio_dev,
static IIO_DEVICE_ATTR(fault, 0644,
ad2s1210_show_fault, ad2s1210_clear_fault, 0);
-static IIO_DEVICE_ATTR(dos_ovr_thrd, 0644,
- ad2s1210_show_reg, ad2s1210_store_reg,
- AD2S1210_REG_DOS_OVR_THRD);
static IIO_DEVICE_ATTR(dos_mis_thrd, 0644,
ad2s1210_show_reg, ad2s1210_store_reg,
AD2S1210_REG_DOS_MIS_THRD);
@@ -791,6 +788,13 @@ static const struct iio_event_spec ad2s1210_monitor_signal_event_spec[] = {
/* Loss of signal threshold. */
.mask_separate = BIT(IIO_EV_INFO_VALUE),
},
+ {
+ /* Sine/cosine DOS overrange fault.*/
+ .type = IIO_EV_TYPE_THRESH,
+ .dir = IIO_EV_DIR_RISING,
+ /* Degredation of signal overrange threshold. */
+ .mask_separate = BIT(IIO_EV_INFO_VALUE),
+ },
};
static const struct iio_chan_spec ad2s1210_channels[] = {
@@ -864,7 +868,6 @@ static const struct iio_chan_spec ad2s1210_channels[] = {
static struct attribute *ad2s1210_attributes[] = {
&iio_dev_attr_fault.dev_attr.attr,
- &iio_dev_attr_dos_ovr_thrd.dev_attr.attr,
&iio_dev_attr_dos_mis_thrd.dev_attr.attr,
&iio_dev_attr_dos_rst_max_thrd.dev_attr.attr,
&iio_dev_attr_dos_rst_min_thrd.dev_attr.attr,
@@ -904,12 +907,15 @@ static IIO_CONST_ATTR(in_phase0_mag_rising_value_available,
__stringify(PHASE_360_DEG_TO_RAD_MICRO));
static IIO_CONST_ATTR(in_altvoltage0_thresh_falling_value_available,
THRESHOLD_RANGE_STR);
+static IIO_CONST_ATTR(in_altvoltage0_thresh_rising_value_available,
+ THRESHOLD_RANGE_STR);
static IIO_DEVICE_ATTR_RO(in_angl1_thresh_rising_value_available, 0);
static IIO_DEVICE_ATTR_RO(in_angl1_thresh_rising_hysteresis_available, 0);
static struct attribute *ad2s1210_event_attributes[] = {
&iio_const_attr_in_phase0_mag_rising_value_available.dev_attr.attr,
&iio_const_attr_in_altvoltage0_thresh_falling_value_available.dev_attr.attr,
+ &iio_const_attr_in_altvoltage0_thresh_rising_value_available.dev_attr.attr,
&iio_dev_attr_in_angl1_thresh_rising_value_available.dev_attr.attr,
&iio_dev_attr_in_angl1_thresh_rising_hysteresis_available.dev_attr.attr,
NULL,
@@ -968,6 +974,9 @@ static int ad2s1210_read_event_value(struct iio_dev *indio_dev,
if (type == IIO_EV_TYPE_THRESH && dir == IIO_EV_DIR_FALLING)
return ad2s1210_get_voltage_threshold(st,
AD2S1210_REG_LOS_THRD, val);
+ if (type == IIO_EV_TYPE_THRESH && dir == IIO_EV_DIR_RISING)
+ return ad2s1210_get_voltage_threshold(st,
+ AD2S1210_REG_DOS_OVR_THRD, val);
return -EINVAL;
case IIO_PHASE:
return ad2s1210_get_phase_lock_range(st, val, val2);
@@ -1001,6 +1010,9 @@ static int ad2s1210_write_event_value(struct iio_dev *indio_dev,
if (type == IIO_EV_TYPE_THRESH && dir == IIO_EV_DIR_FALLING)
return ad2s1210_set_voltage_threshold(st,
AD2S1210_REG_LOS_THRD, val);
+ if (type == IIO_EV_TYPE_THRESH && dir == IIO_EV_DIR_RISING)
+ return ad2s1210_set_voltage_threshold(st,
+ AD2S1210_REG_DOS_OVR_THRD, val);
return -EINVAL;
case IIO_PHASE:
return ad2s1210_set_phase_lock_range(st, val, val2);
--
2.42.0
On Thu, 5 Oct 2023 19:50:26 -0500
David Lechner <[email protected]> wrote:
> The AD2S1210 has a programmable threshold for the degradation of signal
> (DOS) overrange fault. This fault is triggered when either the sine or
> cosine input rises above the threshold voltage.
>
> This patch converts the custom device DOS overrange threshold attribute
> to an event rising edge threshold attribute on the monitor signal
> channel.
>
> The attribute now uses millivolts instead of the raw register value in
> accordance with the IIO ABI.
>
> Emitting the event will be implemented in a later patch.
>
> Signed-off-by: David Lechner <[email protected]>
Applied