Hi All,
This patch series adds support for BT656 mode in the ov772x sensor
and also enables color bar test pattern control.
Cheers,
Prabhakar
Changes for v4:
* New patch 1/3 to fallback in parallel mode.
* Switched to v4l2_fwnode_endpoint_alloc_parse() for parsing the ep.
* Dropped support for pdat for test pattern control.
* DT documentation patches [1].
Changes for v3:
* Dropped DT binding documentation patch as this is handled by Jacopo.
* Fixed review comments pointed by Jacopo.
[1] https://patchwork.kernel.org/project/linux-renesas-soc/list/?series=346809
Lad Prabhakar (3):
media: i2c: ov772x: Parse endpoint properties
media: i2c: ov772x: Add support for BT656 mode
media: i2c: ov772x: Add test pattern control
drivers/media/i2c/ov772x.c | 56 +++++++++++++++++++++++++++++++++++++-
1 file changed, 55 insertions(+), 1 deletion(-)
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2.17.1