Faults have been converted to events and we are now polling the fault
register each time we read a sample, so we no longer need the fault
attribute.
This attribute was not suitable for promotion out of staging anyway
since it was returning multiple values in a single attribute.
The fault clearing feature should not be needed unless we need to
support the fault output pins on the chip which is not currently
supported. So we can add this feature back in if we need it later.
Signed-off-by: David Lechner <[email protected]>
---
v4 changes: New patch in v4.
drivers/staging/iio/resolver/ad2s1210.c | 57 ---------------------------------
1 file changed, 57 deletions(-)
diff --git a/drivers/staging/iio/resolver/ad2s1210.c b/drivers/staging/iio/resolver/ad2s1210.c
index 59c8eed26701..c4e1bc22e8b0 100644
--- a/drivers/staging/iio/resolver/ad2s1210.c
+++ b/drivers/staging/iio/resolver/ad2s1210.c
@@ -312,50 +312,6 @@ static int ad2s1210_reinit_excitation_frequency(struct ad2s1210_state *st,
return regmap_write(st->regmap, AD2S1210_REG_SOFT_RESET, 0);
}
-/* read the fault register since last sample */
-static ssize_t ad2s1210_show_fault(struct device *dev,
- struct device_attribute *attr, char *buf)
-{
- struct ad2s1210_state *st = iio_priv(dev_to_iio_dev(dev));
- unsigned int value;
- int ret;
-
- mutex_lock(&st->lock);
- ret = regmap_read(st->regmap, AD2S1210_REG_FAULT, &value);
- mutex_unlock(&st->lock);
-
- return ret < 0 ? ret : sprintf(buf, "0x%02x\n", value);
-}
-
-static ssize_t ad2s1210_clear_fault(struct device *dev,
- struct device_attribute *attr,
- const char *buf,
- size_t len)
-{
- struct ad2s1210_state *st = iio_priv(dev_to_iio_dev(dev));
- unsigned int value;
- int ret;
-
- mutex_lock(&st->lock);
-
- gpiod_set_value(st->sample_gpio, 1);
- /* delay (2 * tck + 20) nano seconds */
- udelay(1);
- gpiod_set_value(st->sample_gpio, 0);
-
- ret = regmap_read(st->regmap, AD2S1210_REG_FAULT, &value);
- if (ret < 0)
- goto error_ret;
-
- gpiod_set_value(st->sample_gpio, 1);
- gpiod_set_value(st->sample_gpio, 0);
-
-error_ret:
- mutex_unlock(&st->lock);
-
- return ret < 0 ? ret : len;
-}
-
static void ad2s1210_push_events(struct iio_dev *indio_dev,
u8 flags, s64 timestamp)
{
@@ -868,9 +824,6 @@ static int ad2s1210_write_raw(struct iio_dev *indio_dev,
}
}
-static IIO_DEVICE_ATTR(fault, 0644,
- ad2s1210_show_fault, ad2s1210_clear_fault, 0);
-
static const struct iio_event_spec ad2s1210_position_event_spec[] = {
{
/* Tracking error exceeds LOT threshold fault. */
@@ -1020,15 +973,6 @@ static const struct iio_chan_spec ad2s1210_channels[] = {
},
};
-static struct attribute *ad2s1210_attributes[] = {
- &iio_dev_attr_fault.dev_attr.attr,
- NULL,
-};
-
-static const struct attribute_group ad2s1210_attribute_group = {
- .attrs = ad2s1210_attributes,
-};
-
static ssize_t event_attr_voltage_reg_show(struct device *dev,
struct device_attribute *attr,
char *buf)
@@ -1367,7 +1311,6 @@ static const struct iio_info ad2s1210_info = {
.read_avail = ad2s1210_read_avail,
.write_raw = ad2s1210_write_raw,
.read_label = ad2s1210_read_label,
- .attrs = &ad2s1210_attribute_group,
.read_event_value = ad2s1210_read_event_value,
.write_event_value = ad2s1210_write_event_value,
.read_event_label = ad2s1210_read_event_label,
--
2.42.0
On Thu, 5 Oct 2023 19:50:33 -0500
David Lechner <[email protected]> wrote:
> Faults have been converted to events and we are now polling the fault
> register each time we read a sample, so we no longer need the fault
> attribute.
>
> This attribute was not suitable for promotion out of staging anyway
> since it was returning multiple values in a single attribute.
>
> The fault clearing feature should not be needed unless we need to
> support the fault output pins on the chip which is not currently
> supported. So we can add this feature back in if we need it later.
>
> Signed-off-by: David Lechner <[email protected]>
Applied